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TEMs 200KV
Compensateurs de champs magnétiques – JEOL
JEOL JEM-F200 scanning transmission electron microscope with electron energy loss spectroscopy [JEOL-TEM], Quantum-Nano Fabrication and Characterization facility
JEM-F200Multi-purpose ElectronMicroscope, Products
Transmission electron microscope - JEM-F200 - Jeol - for analysis / bright field / dark field
Compensateurs de champs magnétiques – JEOL
Electron Optics, Product Presentations
JEM-F200 - JEOL (Germany) GmbH and Nordic (AB)
Microscope SEM - JIB-4700F - Jeol - pour analyse / EBSD / haute résolution
JEOL JEM-F200 Multi-purpose Electron Microscope
Transmission Electron Microscopes
Transmission electron microscope - JEM-F200 - Jeol - for analysis / bright field / dark field
Microscope électronique à transmission, Microscope TEM - Tous les fabricants de matériel médical